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TCAD
1998
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13 years 4 months ago
Diagnosis of clustered faults and wafer testing
—A probabilistic diagnosis algorithm is presented for constant degree structures. The performance of the algorithm is analyzed under a negative binomial failure distribution to a...
Kaiyuan Huang, Vinod K. Agarwal, Krishnaiyan Thula...
ICLP
2007
Springer
13 years 10 months ago
Automatic Binding-Related Error Diagnosis in Logic Programs
Abstract. This paper proposes a diagnosis algorithm for locating a certain kind of errors in logic programs: variable binding errors that result act symptoms during compile-time ch...
Pawel Pietrzak, Manuel V. Hermenegildo