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    VTS
    1996
    IEEE
    126views Hardware» more  VTS 1996»
    Automatic test generation using genetically-engineered distinguishing sequences
    13 years 8 months ago
    Automatic test generation using genetically-engineered distinguishing sequences
    Download  computing.ece.vt.edu
    A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
    Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
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