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    ITC
    1998
    IEEE
    174views Hardware» more  ITC 1998»
    High volume microprocessor test escapes, an analysis of defects our tests are missing
    13 years 9 months ago
    High volume microprocessor test escapes, an analysis of defects our tests are missing
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    This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
    Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
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