DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
This paper concerns the validity of a widely used method for estimating the architecture-level mean time to failure (MTTF) due to soft errors. The method first calculates the fai...
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
Many important applications in wireless mesh networks require reliable multicast communication. Previously, Forward Error Correction (FEC) techniques have been proved successful f...
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
Studies have shown that device drivers and extensions contain 3–7 times more bugs than other operating system code and thus are more likely to fail. Therefore, we present a fail...
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
Assurance Based Development (ABD) is the synergistic construction of a critical computing system and an assurance case that sets out the dependabilit...
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
This paper considers the problem of electing an eventual leader in an asynchronous shared memory system. While this problem has received a lot of attention in messagepassing syste...
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
A flexible model for estimating reliability of RAID storage systems is presented. This model corrects errors associated with the common assumption that system times to failure fol...
DSN
2007
IEEE
13 years 10 months ago
2007
IEEE
The usage of mobile devices like cell phones, navigation systems, or laptop computers, is limited by the lifetime of the included batteries. This lifetime depends naturally on the...