Sciweavers

Share
warning: Creating default object from empty value in /var/www/modules/taxonomy/taxonomy.module on line 1416.
DT
2006
98views more  DT 2006»
11 years 1 months ago
Handling variations and uncertainties
The widely used engineering decisions concerning the performance of technological equipment for process industries are usually deterministic. Since the early 1990s probabilistic m...
Tim Cheng
DT
2006
72views more  DT 2006»
11 years 1 months ago
On-Chip Testing Techniques for RF Wireless Transceivers
Alberto Valdes-Garcia, José Silva-Mart&iacu...
DT
2006
109views more  DT 2006»
11 years 1 months ago
Test Consideration for Nanometer-Scale CMOS Circuits
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng
DT
2006
94views more  DT 2006»
11 years 1 months ago
A Component-Based Design Environment for ESL Design
gn: abstraction and reuse. The authors present an ESL design flow using the Gezel language. Using several very different design examples, they this design flow supports their case ...
Patrick Schaumont, Ingrid Verbauwhede
DT
2006
69views more  DT 2006»
11 years 1 months ago
Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method
Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, ...
books