VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored an...
ETS
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...