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    2003
    IEEE
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    Relating Yield Models to Burn-In Fall-Out in Time
    13 years 9 months ago
    Relating Yield Models to Burn-In Fall-Out in Time
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    An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
    Thomas S. Barnett, Adit D. Singh
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