Sciweavers

ICASSP
2008
IEEE
13 years 11 months ago
Gradient steepness metrics using extended Baum-Welch transformations for universal pattern recognition tasks
In many pattern recognition tasks, given some input data and a family of models, the “best” model is defined as the one which maximizes the likelihood of the data given the m...
Tara N. Sainath, Dimitri Kanevsky, Bhuvana Ramabha...