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    ICASSP
    2011
    IEEE
    172views Signal Processing» more  ICASSP 2011»
    Detection of elliptical particles in atomic force microscopy images
    12 years 9 months ago
    Detection of elliptical particles in atomic force microscopy images
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    In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; ...
    Jirí Sedlár, Barbara Zitová, ...
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