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ATS
2002
IEEE
101views Hardware» more  ATS 2002»
13 years 9 months ago
An Access Timing Measurement Unit of Embedded Memory
As the deep sub-micron techniques evolving, embedded memories are dominating the yield, while the testing and measurement issues are more difficult due to the access limitations. ...
Shu-Rong Lee, Ming-Jun Hsiao, Tsin-Yuan Chang
ITC
2003
IEEE
168views Hardware» more  ITC 2003»
13 years 9 months ago
A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen ...
FPL
2004
Springer
112views Hardware» more  FPL 2004»
13 years 9 months ago
Storage Allocation for Diverse FPGA Memory Specifications
A previous study [1] demonstrates the advantages of replacing registers by FPGA embedded memories during the storage allocation phase of High-Level Synthesis. The trend in new FPGA...
Dalia Dagher, Iyad Ouaiss
DATE
2005
IEEE
235views Hardware» more  DATE 2005»
13 years 10 months ago
Challenges in Embedded Memory Design and Test
Both the number of embedded memories, as well as the total embedded memory content in our chips is growing steadily. Time for chip designers, EDA makers, and test engineers to upd...
Erik Jan Marinissen, Betty Prince, Doris Keitel-Sc...