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IMSCCS
2007
IEEE
13 years 10 months ago
Control Flow Checking Algorithm using Soft-based Intra-/Inter-block Assigned-Signature
In radiation environments, alpha particles, cosmic rays and solar wind flux can cause a single event upset (SEU), which is one of the major sources of bit-flips in digital electro...
Yanxia Wu, Guochang Gu, Shaobin Huang, Jun Ni