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GLVLSI
2010
IEEE
178views VLSI» more  GLVLSI 2010»
13 years 9 months ago
Improving the testability and reliability of sequential circuits with invariant logic
In this paper, we investigate dual applications for logic implications, which can provide both online error detection capabilities and improve the testing efficiency of an integr...
Nuno Alves, Kundan Nepal, Jennifer Dworak, R. Iris...