ET
1998
13 years 4 months ago
1998
Defining information required by automatic test systems frequently involves a description of system behavior. To facilitate capturing the required behavior information in the cont...
ET
1998
13 years 4 months ago
1998
ET
1998
13 years 4 months ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
ET
1998
13 years 4 months ago
1998
This paper extends the design method of self-testing checkers (STCs) for some m-out-of-n (m/n) codes, proposed recently in IEEE Trans. Comput., 1995 by Dimakopoulos et al. The chec...