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ET
2000
80views more  ET 2000»
13 years 3 months ago
A New Method for Testing Re-Programmable PLAs
: We present a method for obtaining a minimal set of test configurations and their associated set oftest patterns that completely tests re-programmable Programmable Logic Arrays (P...
Charles E. Stroud, James R. Bailey, Johan R. Emmer...
ET
2000
73views more  ET 2000»
13 years 3 months ago
Deterministic BIST with Partial Scan
An efficient deterministic BIST scheme based on partial scan chains together with a scan selection algorithm tailored for BIST is presented. The algorithm determines a minimum num...
Gundolf Kiefer, Hans-Joachim Wunderlich
ET
2000
98views more  ET 2000»
13 years 3 months ago
Low Power BIST by Filtering Non-Detecting Vectors
Salvador Manich, A. Gabarró, M. Lopez, Joan...
ET
2000
145views more  ET 2000»
13 years 3 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar