ET
2007
13 years 4 months ago
2007
We propose a built-in self-test (BIST) procedure for nanofabrics implemented using chemically assembled electronic nanotechnology. Several fault detection configurations are prese...
ET
2007
13 years 4 months ago
2007
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...