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ETS
2007
IEEE
110views Hardware» more  ETS 2007»
13 years 10 months ago
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement
— A novel statistical learning algorithm is proposed to accurately analyze volume diagnosis results. This algorithm effectively overcomes the inherent ambiguities in logic diagno...
Huaxing Tang, Manish Sharma, Janusz Rajski, Martin...
ETS
2007
IEEE
109views Hardware» more  ETS 2007»
13 years 10 months ago
Test Configurations for Diagnosing Faulty Links in NoC Switches
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...
Jaan Raik, Raimund Ubar, Vineeth Govind
ETS
2007
IEEE
94views Hardware» more  ETS 2007»
13 years 10 months ago
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...
ETS
2007
IEEE
102views Hardware» more  ETS 2007»
13 years 10 months ago
Adaptive Debug and Diagnosis without Fault Dictionaries
Stefan Holst, Hans-Joachim Wunderlich
ETS
2007
IEEE
91views Hardware» more  ETS 2007»
13 years 10 months ago
PPM Reduction on Embedded Memories in System on Chip
This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests a...
Said Hamdioui, Zaid Al-Ars, Javier Jiménez,...
ETS
2007
IEEE
81views Hardware» more  ETS 2007»
13 years 10 months ago
Parallel Scan-Like Testing and Fault Diagnosis Techniques for Digital Microfluidic Biochips
Dependability is an important attribute for microfluidic biochips that are used for safety-critical applications such as point-of-care health assessment, air-quality monitoring, a...
Tao Xu, Krishnendu Chakrabarty