ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
—As circuits continue to scale to smaller feature sizes, wearout and latent defects are expected to cause an increasing number of errors in the field. Online error detection tec...
ETS
2011
IEEE
12 years 4 months ago
2011
IEEE
—The notion of Architectural Vulnerability Factor (AVF) has been extensively used by designers to evaluate various aspects of design robustness. While AVF is a very accurate way ...