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    ISQED
    2006
    IEEE
    118views Hardware» more  ISQED 2006»
    Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices
    13 years 10 months ago
    Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices
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    This paper presents a unique SEU (single Event Upset) mitigation technique based upon Temporal Data Sampling for synchronous circuits and configuration bit storage for programmabl...
    Sajid Baloch, Tughrul Arslan, Adrian Stoica
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