ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
A high-level test synthesis (HLTS) method targeted for delay fault testability is presented. The proposed method, when combined with hierarchical test pattern generation for embed...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Future microprocessors will be highly susceptible to transient errors as the sizes of transistors decrease due to CMOS scaling. Prior techniques advocated full scale structural or...
DSD
2009
IEEE
13 years 11 months ago
2009
IEEE
—Fault tolerance (FT) is becoming increasingly important in computing systems. This work proposes and evaluates the instruction precomputation technique to detect hardware faults...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
DAC
2003
ACM
14 years 5 months ago
2003
ACM
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the PRPG before filling the scan chain. In this paper, we present...