CDC
2009
IEEE
13 years 2 months ago
2009
IEEE
The paper described a novel method for detecting and identifying faults that occur in the actuator of control systems with input and output signals related to the component itself....
JNW
2006
13 years 4 months ago
2006
The design of large dependable multiprocessor systems requires quick and precise mechanisms for detecting the faulty nodes. The problem of system-level fault diagnosis is computati...
ET
2006
13 years 4 months ago
2006
1 Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of the...
DAGSTUHL
2004
13 years 5 months ago
2004
A well-studied problem in fault diagnosis is to identify the set of all good processors in a given set {p1, p2, . . . , pn} of processors via asking some processors pi to test whet...
ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
ITC
1998
IEEE
13 years 8 months ago
1998
IEEE
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
ITC
2000
IEEE
13 years 8 months ago
2000
IEEE
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...