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CDC
2009
IEEE
176views Control Systems» more  CDC 2009»
9 years 1 months ago
Actuator fault detection and diagnosis based on morphology-wavelet
The paper described a novel method for detecting and identifying faults that occur in the actuator of control systems with input and output signals related to the component itself....
Yi Zhang, GuoLian Hou, Baojiang Wu
JNW
2006
108views more  JNW 2006»
9 years 3 months ago
System-Level Fault Diagnosis Using Comparison Models: An Artificial-Immune-Systems-Based Approach
The design of large dependable multiprocessor systems requires quick and precise mechanisms for detecting the faulty nodes. The problem of system-level fault diagnosis is computati...
Mourad Elhadef, Shantanu Das, Amiya Nayak
ET
2006
98views more  ET 2006»
9 years 3 months ago
Accurate Whole-Chip Diagnostic Strategy for Scan Designs with Multiple Faults
1 Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of the...
Yu-Chiun Lin, Shi-Yu Huang
DAGSTUHL
2004
9 years 5 months ago
Finding Isolated Cliques by Queries -- An Approach to Fault Diagnosis with Many Faults
A well-studied problem in fault diagnosis is to identify the set of all good processors in a given set {p1, p2, . . . , pn} of processors via asking some processors pi to test whet...
William I. Gasarch, Frank Stephan
ITC
1997
IEEE
93views Hardware» more  ITC 1997»
9 years 8 months ago
Fault Diagnosis in Scan-Based BIST
A deterministic-partitioning technique and an improved analysis scheme for fault diagnosis in Scan-Based BIST is proposed. The incorporation of the superposition principle to the ...
Janusz Rajski, Jerzy Tyszer
ITC
1998
IEEE
117views Hardware» more  ITC 1998»
9 years 8 months ago
On applying non-classical defect models to automated diagnosis
Automated fault diagnosis based on the stuckat fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis techniqu...
Jayashree Saxena, Kenneth M. Butler, Hari Balachan...
ITC
2000
IEEE
101views Hardware» more  ITC 2000»
9 years 8 months ago
Deterministic partitioning techniques for fault diagnosis in scan-based BIST
A deterministic partitioning technique for fault diagnosis in Scan-Based BIST is proposed. Properties of high quality partitions for improved fault diagnosis times are identified...
Ismet Bayraktaroglu, Alex Orailoglu
ITC
2002
IEEE
112views Hardware» more  ITC 2002»
9 years 8 months ago
Multiplets, Models, and the Search for Meaning: Improving Per-Test Fault Diagnosis
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...
David B. Lavo, Ismed Hartanto, Tracy Larrabee
DATE
2010
IEEE
185views Hardware» more  DATE 2010»
9 years 9 months ago
Fault diagnosis of analog circuits based on machine learning
— We discuss a fault diagnosis scheme for analog integrated circuits. Our approach is based on an assemblage of learning machines that are trained beforehand to guide us through ...
Ke Huang, Haralampos-G. D. Stratigopoulos, Salvado...
ATS
2003
IEEE
110views Hardware» more  ATS 2003»
9 years 9 months ago
Chip-Level Diagnostic Strategy for Full-Scan Designs with Multiple Faults
Fault diagnosis of full-scan designs has been progressed significantly. However, most existing techniques are aimed at a logic block with a single fault. Strategies on top of thes...
Yu-Chiun Lin, Shi-Yu Huang
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