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    DATE
    2000
    IEEE
    121views Hardware» more  DATE 2000»
    Functional Test Generation for Full Scan Circuits
    13 years 9 months ago
    Functional Test Generation for Full Scan Circuits
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    We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
    Irith Pomeranz, Sudhakar M. Reddy
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