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    DAC
    2005
    ACM
    116views Computer Architecture» more  DAC 2005»
    Path delay test compaction with process variation tolerance
    13 years 6 months ago
    Path delay test compaction with process variation tolerance
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    In this paper we propose a test compaction method for path delay faults in a logic circuit. The method generates a compact set of two-pattern tests for faults on long paths select...
    Seiji Kajihara, Masayasu Fukunaga, Xiaoqing Wen, T...
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