Sciweavers

ICPADS
1998
IEEE
13 years 8 months ago
The XBW Model for Dependable Real-Time Systems
This paper presents a new conceptual model, the XBWModel. Distributed computing is becoming a cost effective way to implement safety critical control systems. To support the devel...
Vilgot Claesson, Stefan Poledna, Jan Söderber...
ICCAD
2000
IEEE
171views Hardware» more  ICCAD 2000»
13 years 8 months ago
A Parametric Test Method for Analog Components in Integrated Mixed-Signal Circuits
In this paper, we present a novel approach to use test stimuli generated by digital components of a mixed-signal circuit for testing its analog components. A wavelet transform is ...
Michael Pronath, Volker Gloeckel, Helmut E. Graeb
EVOW
2001
Springer
13 years 8 months ago
ARPIA: A High-Level Evolutionary Test Signal Generator
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
Fulvio Corno, Gianluca Cumani, Matteo Sonza Reorda...
GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
13 years 8 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham
DFT
2002
IEEE
127views VLSI» more  DFT 2002»
13 years 8 months ago
A New Functional Fault Model for FPGA Application-Oriented Testing
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo ...
CLUSTER
2002
IEEE
13 years 8 months ago
Design and Validation of Portable Communication Infrastructure for Fault-Tolerant Cluster Middleware
We describe the communication infrastructure (CI) for our fault-tolerant cluster middleware, which is optimized for two classes of communication: for the applications and for the ...
Ming Li, Wenchao Tao, Daniel Goldberg, Israel Hsu,...
IPPS
2005
IEEE
13 years 9 months ago
A Maintenance-Oriented Fault Model for the DECOS Integrated Diagnostic Architecture
Abstract— The increasing use of electronics in the automotive and avionic domain has lead to dramatic improvements with respect to functionality, safety, and cost. However, with ...
Philipp Peti, Roman Obermaisser, Astrit Ademaj, He...
DSN
2005
IEEE
13 years 9 months ago
Design Time Reliability Analysis of Distributed Fault Tolerance Algorithms
Designing a distributed fault tolerance algorithm requires careful analysis of both fault models and diagnosis strategies. A system will fail if there are too many active faults, ...
Elizabeth Latronico, Philip Koopman
DATE
2006
IEEE
89views Hardware» more  DATE 2006»
13 years 9 months ago
Generation of broadside transition fault test sets that detect four-way bridging faults
Generation of n -detection test sets is typically done for a single fault model. In this work we investigate the generation of n -detection test sets by pairing each fault of a ta...
Irith Pomeranz, Sudhakar M. Reddy
MEMOCODE
2007
IEEE
13 years 10 months ago
Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
Stephan Eggersglüß, Görschwin Fey,...