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IOLTS
2003
IEEE
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13 years 10 months ago
The positive effect on IC yield of embedded Fault Tolerance for SEUs
Fault tolerant design is a technique emerging in Integrated Circuits (IC’s) to deal with the increasing error susceptibility (Soft Errors, or Single Event Upsets, SEU) caused by...
André K. Nieuwland, Richard P. Kleihorst