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ETS
2007
IEEE
110views Hardware» more  ETS 2007»
13 years 11 months ago
Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement
— A novel statistical learning algorithm is proposed to accurately analyze volume diagnosis results. This algorithm effectively overcomes the inherent ambiguities in logic diagno...
Huaxing Tang, Manish Sharma, Janusz Rajski, Martin...