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DATE
2007
IEEE
92views Hardware» more  DATE 2007»
13 years 11 months ago
Test quality analysis and improvement for an embedded asynchronous FIFO
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clock...
Tobias Dubois, Erik Jan Marinissen, Mohamed Aziman...