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ISCAS
2002
IEEE
94views Hardware» more  ISCAS 2002»
13 years 9 months ago
Modeling hot-electrons effects in silicon-on-sapphire MOSFETs
A unified, closed form analytical drain current model for partially and fully depleted SOS MOSFETs was investigated. The analytical model was developed using first order principle...
Eugenio Culurciello, Andreas G. Andreou, Philippe ...