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DATE
1999
IEEE
120views Hardware» more  DATE 1999»
11 years 11 months ago
FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
Yanti Santoso, Matthew C. Merten, Elizabeth M. Rud...
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