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ETS
2011
IEEE
220views Hardware» more  ETS 2011»
12 years 3 months ago
Structural In-Field Diagnosis for Random Logic Circuits
—In-field diagnosability of electronic components in larger systems such as automobiles becomes a necessity for both customers and system integrators. Traditionally, functional ...
Alejandro Cook, Melanie Elm, Hans-Joachim Wunderli...
VTS
2007
IEEE
100views Hardware» more  VTS 2007»
13 years 10 months ago
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...
Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srik...