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2007
IEEE
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13 years 10 months ago
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...
Vishnu C. Vimjam, Enamul Amyeen, Ruifeng Guo, Srik...