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    MTDT
    2000
    IEEE
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    Diagnostic Testing of Embedded Memories Based on Output Tracing
    13 years 9 months ago
    Diagnostic Testing of Embedded Memories Based on Output Tracing
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    A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
    Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...
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