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ICCAD
2000
IEEE
77views Hardware» more  ICCAD 2000»
13 years 9 months ago
Improving the Proportion of At-Speed Tests in Scan BIST
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
Yu Huang, Irith Pomeranz, Sudhakar M. Reddy, Janus...