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    DATE
    2010
    IEEE
    171views Hardware» more  DATE 2010»
    Digital statistical analysis using VHDL
    13 years 10 months ago
    Digital statistical analysis using VHDL
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    —Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
    Manfred Dietrich, Uwe Eichler, Joachim Haase
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