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DATE
2009
IEEE
135views Hardware» more  DATE 2009»
13 years 10 months ago
Gate replacement techniques for simultaneous leakage and aging optimization
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao,...