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    ICCAD
    2006
    IEEE
    141views Hardware» more  ICCAD 2006»
    Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
    14 years 1 months ago
    Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
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    An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
    Mihir R. Choudhury, Quming Zhou, Kartik Mohanram
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