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ASPDAC
2008
ACM
115views Hardware» more  ASPDAC 2008»
13 years 5 months ago
GECOM: Test data compression combined with all unknown response masking
This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE
Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsu...