Sciweavers

DAGM
2004
Springer
13 years 10 months ago
Using Pattern Recognition for Self-Localization in Semiconductor Manufacturing Systems
In this paper we present a new method for self-localization on wafers using geometric hashing. The proposed technique is robust to image changes induced by process variations, as o...
Michael Lifshits, Roman Goldenberg, Ehud Rivlin, M...
ICIP
2001
IEEE
14 years 6 months ago
Geometric hashing techniques for watermarking
In this paper we introduce the idea of using Computer Vision techniques for improving and enhancing watermarking capabilities. Specifically, we incorporate Geometric Hashing techn...
Hagit Zabrodsky Hel-Or, Y. Yitzhaki, Yacov Hel-Or