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ICCD
2006
IEEE
157views Hardware» more  ICCD 2006»
11 years 28 days ago
Statistical Analysis of Power Grid Networks Considering Lognormal Leakage Current Variations with Spatial Correlation
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
Ning Mi, Jeffrey Fan, Sheldon X.-D. Tan
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