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ICCD
2007
IEEE
125views Hardware» more  ICCD 2007»
14 years 16 days ago
Low-cost run-time diagnosis of hard delay faults in the functional units of a microprocessor
This paper addresses the run-time diagnosis of delay faults in functional units of microprocessors. Despite the popularity of the stuck-at fault model, it is no longer the only re...
Sule Ozev, Daniel J. Sorin, Mahmut Yilmaz