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ET
2002
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13 years 3 months ago
Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
In this paper a novel architecture for scan-based mixed mode BIST is presented. To reduce the storage requirements for the deterministic patterns it relies on a two-dimensional co...
Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wun...