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    ICCAD
    1998
    IEEE
    122views Hardware» more  ICCAD 1998»
    Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits
    13 years 8 months ago
    Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits
    Download  www.cs.york.ac.uk
    In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
    Vamsi Boppana, W. Kent Fuchs
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    ICCAD
    1998
    IEEE
    71views Hardware» more  ICCAD 1998»
    Dynamic power management of electronic systems
    13 years 8 months ago
    Dynamic power management of electronic systems
    Download  si2.epfl.ch
    Luca Benini, Alessandro Bogliolo, Giovanni De Mich...
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    ICCAD
    1998
    IEEE
    87views Hardware» more  ICCAD 1998»
    Gate-size selection for standard cell libraries
    13 years 8 months ago
    Gate-size selection for standard cell libraries
    Download  www.cad.t.u-tokyo.ac.jp
    Frederik Beeftink, Prabhakar Kudva, David S. Kung,...
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