ICCAD
2001
IEEE
14 years 1 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
ICCAD
2001
IEEE
14 years 1 months ago
2001
IEEE
tems. STARS manipulates abstract representations of system components to obtain upper bounds on the number of various events in the system, as well as a bound on the response time....