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ICCAD
2007
IEEE
135views Hardware» more  ICCAD 2007»
9 years 11 months ago
A selective pattern-compression scheme for power and test-data reduction
— This paper proposes a selective pattern-compression scheme to minimize both test power and test data volume during scan-based testing. The proposed scheme will selectively supp...
Chia-Yi Lin, Hung-Ming Chen
ICCAD
2007
IEEE
115views Hardware» more  ICCAD 2007»
9 years 11 months ago
Parameterized model order reduction via a two-directional Arnoldi process
Abstract—This paper presents a multiparameter momentmatching based model order reduction technique for parameterized interconnect networks via a novel two-directional Arnoldi pro...
Yung-Ta Li, Zhaojun Bai, Yangfeng Su, Xuan Zeng
ICCAD
2007
IEEE
143views Hardware» more  ICCAD 2007»
9 years 11 months ago
TIP-OPC: a new topological invariant paradigm for pixel based optical proximity correction
—As the 193nm lithography is likely to be used for 45nm and even 32nm processes, much more stringent requirement will be posed on Optical Proximity Correction (OPC) technologies....
Peng Yu, David Z. Pan
ICCAD
2007
IEEE
64views Hardware» more  ICCAD 2007»
9 years 11 months ago
A simultaneous bus orientation and bused pin flipping algorithm
— The orientation of a bus is defined as the direction from the Least Significant Bit (LSB) to the Most Significant Bit (MSB). Bused pin flipping is a property that allows severa...
Fan Mo, Robert K. Brayton
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