ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
— In this paper, we approach the gate sizing problem in VLSI circuits in the context of increasing variability of process and circuit parameters as technology scales into the nan...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
Existing schemes for cache energy optimization incorporate a limited degree of dynamic associativity: either direct mapped or full available associativity (say 4-way). In this pap...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
In this paper we present a clustered, multiple-clock domain (CMCD) microarchitecture that combines the benefits of both clustering and Globally Asynchronous Locally Synchronous (G...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
Three dimensional vertically integrated systems allow active devices to be placed on multiple device layers. In recent years, a number of research efforts have addressed physical ...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
In this work we propose a methodology for the accurate analysis of the power consumption of interprocessor communication in a MPSoC, and the construction of high-level power macro...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
Redundant rows and columns have been used for years to improve the yield of DRAM fabrication. However, finding a memory repair solution has been proved to be an NP-complete proble...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
Dynamic address compression schemes that exploit address locality can help reduce both address bus energy and cost simultaneously with only a small performance penalty. In this wo...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
This paper describes XTalkDelay, an industrial-strength methodology and tool for measuring the impact of crosstalk on delays of paths in a design. The main cornerstone of XTalkDel...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
A negative effect of ever-shrinking supply and threshold voltages is the larger percentage of total power consumption that comes from leakage current. Several techniques have been...