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ICECCS
2002
IEEE
86views Hardware» more  ICECCS 2002»
13 years 9 months ago
A Light-Weight Process for Capturing and Evolving Defect Reduction Experience
Victor R. Basili, Mikael Lindvall, Forrest Shull
ICECCS
2002
IEEE
85views Hardware» more  ICECCS 2002»
13 years 9 months ago
Syntactic Fault Patterns in OO Programs
Although program faults are widely studied, there are many aspects of faults that we still do not understand, particularly about OO software. In addition to the simple fact that o...
Roger T. Alexander, Jeff Offutt, James M. Bieman