ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
The development of network-attached devices has ushered in an era of autonomous, multi-function equipment demanding minimal human interaction: the only requirements are data and e...
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper introduces a framework for classifying and comparing three domains related to the process technology. More particularly, it gives process definitions, characteristics, m...
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
We investigate the trade off between investing effort in improving the features of a research environment that increases productivity and investing such effort in actually conduct...
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
Following the agile philosophy that all core features of a system need an automated test harness, performance requirements also need such a check when they are essential for the s...
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
We present experiences from a two-year study of adopting pair programming (PP) in a Finnish software product company. When adopting PP, the company used five tactics: the creation...
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
Knowledge management is the key area of focus in the present information technology scenario. It forms a basis to derive standards and models and steers organizations through an e...
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
Highly successful scientific disciplines have at least one common denominator; they have developed unified theories that span a large set of phenomena within the discipline. The d...
ICSEA
2007
IEEE
13 years 11 months ago
2007
IEEE
The integration of query languages and programming languages is still a central problem of database research. In particular, issues with respect to the impedance mismatch are of i...