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    VLSID
    2003
    IEEE
    114views VLSI» more  VLSID 2003»
    Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs
    14 years 5 months ago
    Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs
    Download  www.essderc2002.deis.unibo.it
    Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface ...
    S. Mahapatra, S. Shukuri, Jeff Bude
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