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MVA
2007
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13 years 6 months ago
A Physics-Based Imaging Model of Scanning Electron Microscopes
This paper discusses a physics-based imaging model of scanning electron microscopes (SEM). The purpose is to accurately examine the imaging process of a SEM, which has to be neces...
Kousuke Kamada, Takayuki Okatani, Koichiro Deguchi
CVPR
2008
IEEE
13 years 6 months ago
Photometric stereo with coherent outlier handling and confidence estimation
In photometric stereo a robust method is required to deal with outliers, such as shadows and non-Lambertian reflections. In this paper we rely on a probabilistic imaging model tha...
Frank Verbiest, Luc J. Van Gool