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ICCAD
2009
IEEE
101views Hardware» more  ICCAD 2009»
13 years 1 months ago
Compacting test vector sets via strategic use of implications
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
Nuno Alves, Jennifer Dworak, R. Iris Bahar, Kundan...