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ICANN
2011
Springer
12 years 7 months ago
Bias of Importance Measures for Multi-valued Attributes and Solutions
Attribute importance measures for supervised learning are important for improving both learning accuracy and interpretability. However, it is well-known there could be bias when th...
Houtao Deng, George C. Runger, Eugene Tuv
COMPSAC
2003
IEEE
13 years 9 months ago
A Cut-Based Algorithm for Reliability Analysis of Terminal-Pair Network Using OBDD
In this paper, we propose an algorithm to construct the Ordered Binary Decision Diagram (OBDD) representing the cut function of a terminal-pair network. The algorithm recognizes i...
Yung-Ruei Chang, Hung-Yau Lin, Ing-Yi Chen, Sy-Yen...